Criteria and considerations for preparing atom-probe tomography specimens of nanomaterials utilizing an encapsulation methodology-Reference-Cited by-同舟云学术

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Criteria and considerations for preparing atom-probe tomography specimens of nanomaterials utilizing an encapsulation methodology

Published:2018-01 Issue: Volume:184 Page:225-233
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Sun Zhiyuan,Hazut Ori,Yerushalmi Roie,Lauhon Lincoln J.,Seidman David N.

Funder

United States–Israel Binational Science Foundation

Northwestern University

National Science Foundation

Office of Naval Research

National Science Foundation's MRSEC Program

MRSEC program

Soft and Hybrid Nanotechnology Experimental (SHyNE) Resource

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference51 articles.

1. The effects of refractory elements on Ni-excesses and Ni-depletions at γ (fcc)/γ′(L1 2) interfaces in model Ni-based superalloys: atom-probe tomographic experiments and first-principles calculations;Huang;Acta Mater.,2016

2. Dopant diffusion and activation in silicon nanowires fabricated by ex situ doping: a correlative study via atom-probe tomography and scanning tunneling spectroscopy;Sun;Nano Lett.,2016

3. Atom probe tomography evidence for uniform incorporation of Bi across the growth front in GaAs 1− x Bix/GaAs superlattice;Chen;J. Cryst. Growth,2016

4. Atom probe tomography of interfaces in ceramic films and oxide scales;Stiller;MRS Bull.,2016

5. Probing grain-boundary chemistry and electronic structure in proton-conducting oxides by atom probe tomography;Clark;Nano Lett.,2016

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1. Direct Observation of Trace Elements in Barium Titanate of Multilayer Ceramic Capacitors Using Atom Probe Tomography;Microscopy and Microanalysis;2024-05-04

2. Ga-induced delithiation of grain boundaries in a Li containing Al-based alloy;Materials Characterization;2023-05

3. Investigation of an atomic‐layer‐deposited Al 2 O 3 diffusion barrier between Pt and Si for the use in atomic scale atom probe tomography studies on a combinatorial processing platform;Surface and Interface Analysis;2021-05-11

4. Atom Probe Tomography of Encapsulated Hydroxyapatite Nanoparticles;Small Methods;2020-12-13

5. Remote Doping of Scalable Nanowire Branches;Nano Letters;2020-04-21

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