Bandgap measurement of thin dielectric films using monochromated STEM-EELS-Reference-Cited by-同舟云学术

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Bandgap measurement of thin dielectric films using monochromated STEM-EELS

Published:2009-08 Issue:9 Volume:109 Page:1183-1188
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Park Jucheol,Heo Sung,Chung Jae-Gwan,Kim Heekoo,Lee HyungIk,Kim Kihong,Park Gyeong-Su

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference27 articles.

1. Performance Improvement of SONOS Memory by Bandgap Engineering of Charge-Trapping Layer

2. Development of a high energy resolution electron energy-loss spectroscopy microscope

3. Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy

4. Quantification of the size-dependent energy gap of individual CdSe quantum dots by valence electron energy-loss spectroscopy

5. The impact of surface and retardation losses on valence electron energy-loss spectroscopy

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1. Atomic Structure and Electronic Properties of Pristine and O-Doped Basal-Plane Inversion Domain Boundaries in AlN;The Journal of Physical Chemistry C;2024-07-29

2. Dynamic STEM-EELS for single-atom and defect measurement during electron beam transformations;Science Advances;2024-07-19

3. Automated Bandgap Measurements in Optoelectronic Devices by Monochromated Electron Energy-Loss Spectroscopy;Microscopy and Microanalysis;2024-07

4. Discovering invariant spatial features in electron energy loss spectroscopy images on the mesoscopic and atomic levels;Journal of Applied Physics;2024-03-21

5. The atomic and electronic band structures in Ca/Si-doped and Ca/Si/Ti-doped Al2O3 grain boundaries;Journal of the European Ceramic Society;2024-02

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