Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference52 articles.
1. Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope;Varela;Annu Rev Mater Res,2005
2. Transmission Electron Microscopy;Williams,2009
3. Scanning Transmission Electron Microscopy,2011
4. Nanocharacterisation;Kirkland,2015
5. Electron ptychography of 2D materials to deep sub-ångström resolution;Jiang;Nature,2018
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