Towards high accuracy calibration of electron backscatter diffraction systems
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference20 articles.
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3. Accuracy assessment of elastic strain measurement by EBSD;Villert;Journal of Microscopy,2009
4. Bragg’s law diffraction simulations for electron backscatter diffraction analysis;Kacher;Ultramicroscopy,2009
5. Comments on the paper “Bragg's law diffraction simulations for electron backscatter diffraction analysis” by Josh Kacher, Colin Landon, Brent L. Adams & David Fullwood;Maurice;Ultramicroscopy,2010
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