High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
2. Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope
3. Measurement of elastic strains and small lattice rotations using electron back scatter diffraction
4. Measuring strains using electron backscatter diffraction;Wilkinson,2000
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