Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.108758
Reference6 articles.
1. Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope
2. Accurate microcrystallography at high spatial resolution using electron back-scattering patterns in a field emission gun scanning electron microscope
3. Application of backscatter Kikuchi diffraction in the scanning electron microscope to the study of NiS2
4. On the origin of recrystallization textures in aluminium
5. Quantitative deformation studies using electron back scatter patterns
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