Accurate and fast localization of EBSD pattern centers for screen moving technology-Reference-Cited by-同舟云学术

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Accurate and fast localization of EBSD pattern centers for screen moving technology

Published:2024-05 Issue: Volume:259 Page:113924
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Li Wei,Zhou Xingui,Xu Jingchao,Zhang Ruyue,Lai Lizhao,Zeng Yi,Miao Hong^ORCID

Publisher

Elsevier BV

Reference29 articles.

1. Applications of electron backscatter diffraction to materials science: status in 2009;Randle;J. Mater. Sci.,2009

2. Observations of lattice curvature near the interface of a deformed aluminium bicrystal;Sun;Philos. Mag. A,2000

3. Error analysis of the crystal orientations and disorientations obtained by the classical electron backscatter diffraction technique;Ram;J. Appl. Crystallogr.,2015

4. High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity;Wilkinson;Ultramicroscopy,2006

5. Limits of simulation based high resolution EBSD;Alkorta;Ultramicroscopy,2013

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