Nanowire facilitated transfer of sensitive TEM samples in a FIB
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference44 articles.
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4. Focused ion beam milling and micromanipulation lift-out for site specific cross-section tem specimen preparation;Giannuzzi;MRS Proc.,1997
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