Semi-custom methodology to fabricate transmission electron microscopy chip for in situ characterization of nanodevices and nanomaterials
Author:
Publisher
Springer Science and Business Media LLC
Subject
General Engineering,General Materials Science
Link
https://link.springer.com/content/pdf/10.1007/s11431-021-1980-1.pdf
Reference45 articles.
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4. Taheri M L, Stach E A, Arslan I, et al. Current status and future directions for in situ transmission electron microscopy. Ultramicroscopy, 2016, 170: 86–95
5. Wu J, Shan H, Chen W, et al. In situ environmental TEM in imaging gas and liquid phase chemical reactions for materials research. Adv Mater, 2016, 28: 9686–9712
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