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A high-speed atomic force microscopy with super resolution based on path planning scanning

  • Published:2020-06 Issue: Volume:213 Page:112991
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Wu Yinan,Fang Yongchun,Wang Chao,Liu Cunhuan,Fan Zhi

Funder

National Natural Science Foundation of China-Key Program

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference38 articles.

1. Adaptive-scanning, near-minimum-deformation atomic force microscope imaging of soft sample in liquid: live mammalian cell example;Ren;Ultramicroscopy,2018

2. High-speed AFM imaging of nanopositioning stages using h∞ and iterative learning control;Xie;IEEE Trans. Ind. Electron.,2019

3. A new ion sensing deep atomic force microscope;Drake;Rev. Sci. Instrum.,2014

4. High-speed atomic force microscopy and its future prospects;Ando;Biophys. Rev.,2018

5. A review of feedforward control approaches in nanopositioning for high-speed SPM;Clayton;J. Dyn. Syst. Meas. Control,2009

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