A new ion sensing deep atomic force microscope
Author:
Affiliation:
1. Department of Physics, University of California, Santa Barbara, California 93106, USA
Funder
National Institutes of Health (NIH)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4893640
Reference14 articles.
1. Deep atomic force microscopy
2. Atomic Force Microscope
3. Scanning ion conductance microscopy with distance-modulated shear force control
4. Scanning Ion Conductance Microscopy
5. Atomic Force Microscopy
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