Laser assisted atom probe analysis of thin film on insulating substrate
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference30 articles.
1. R. Busch, S. Schneider, K. Samwer, Nachrichten der Akademie der Wissenschaften in Gottingen, Nr. 1, 1991.
2. Direct evidence for compositional fluctuation in sputtered Co-Cr thin films
3. Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP
4. Thin film interreaction of Al/Ag analyzed by tomographic atom probe
5. APT analyses of deuterium-loaded Fe/V multi-layered films
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM;Ultramicroscopy;2023-05
2. Understanding of Capping Effects on the Tip Shape Evolution and on the Atom Probe Data of Bulk LaAlO3 Using Transmission Electron Microscopy;Microscopy and Microanalysis;2017-02-20
3. Challenges in the study of Fe/MgO/Fe interfaces using 3D Atom Probe;Thin Solid Films;2015-08
4. Recent progress in III-V based ferromagnetic semiconductors: Band structure, Fermi level, and tunneling transport;Applied Physics Reviews;2014-03
5. Atom-Probe Field Ion Microscopy;Physical Metallurgy;2014
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3