Thin film interreaction of Al/Ag analyzed by tomographic atom probe
Author:
Publisher
Elsevier BV
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Reference11 articles.
1. Diffusion-Reaction: Growth and Nucleation
2. Calorimetric and other studies of intermetallic phase formation in Ag/Al bilayer thin films
3. Investigating the thermodynamics and kinetics of thin film reactions by differential scanning calorimetry
4. Experimental evidence for nucleation during thin‐film reactions
5. Atomic-scale APFIM and TEM investigation of grain boundary microchemistry in Astroloy nickel base superalloys
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1. Microstructural Transformations in Solid-State Annealed Al/Ag/Al Diffusion Couples Examined via High-Voltage Electron Microscopy (HVEM);Metals;2023-10-20
2. Effect of the Structural Properties on the Electrical Resistivity of the Al/Ag Thin Films during the Solid-State Reaction;Physics of the Solid State;2020-04
3. Effect of Au Addition on the Microstructure and Properties of Ag-4Pd Bonding Wires;Metallurgical and Materials Transactions A;2018-07-26
4. Atomic scale analysis of phase formation and diffusion kinetics in Ag/Al multilayer thin films;Journal of Applied Physics;2016-11-21
5. A simple approach to atom probe sample preparation by using shadow masks;Ultramicroscopy;2016-01
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