Atom-Probe Field Ion Microscopy
Author:
Publisher
Elsevier
Reference490 articles.
1. Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP
2. Coupled-solute drag effects on ferrite formation in Fe–C–X systems;Aaronson;Metall. Mater. Trans. A,2004
3. Long-period ordered structure in a high-strength nanocrystalline Mg-1 at% Zn-2 at% Y alloy studied by atomic-resolution Z-contrast STEM
4. Phase separation and glass-forming abilities of ternary alloys
5. Characterzing atomic composition and dopant distribution in wide band gap semiconductor nanowires using laser assisted atom probe tomography;Agrawal;J. Phys. Chem. C,2011
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5. Role of C and B4C barrier layers in controlling diffusion propagation across the interface of Cr/Sc multilayers;Physical Chemistry Chemical Physics;2023
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