Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction-Reference-Cited by-同舟云学术

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Thickness and defocus dependence of inter-atomic electric fields measured by scanning diffraction

Published:2020-01 Issue: Volume:208 Page:112850
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Addiego Christopher,Gao Wenpei,Pan Xiaoqing

Funder

U.S. Department of Energy

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference21 articles.

1. Ferroelectric-field-effect-enhanced electroresistance in metal/ferroelectric/semiconductor tunnel junctions;Wen;Nat. Mater.,2013

2. Effect of a built-in electric field in asymmetric ferroelectric tunnel junctions;Liu;Phys. Rev. B,2013

3. Spontaneous vortex nanodomain arrays at ferroelectric heterointerfaces;Nelson;Nano Lett.,2011

4. Atomically resolved mapping of polarization and electric fields across ferroelectric/oxide interfaces by Z-contrast imaging;Chang;Adv. Mater.,2011

5. Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction;Müller;Nat. Commun.,2014

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