Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging-Reference-Cited by-同舟云学术

Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging

Published:2011-04-29 Issue:21 Volume:23 Page:2474-2479
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Chang Hye Jung,Kalinin Sergei V.,Morozovska Anna N.,Huijben Mark,Chu Ying-Hao,Yu Pu,Ramesh Ramamoorthy,Eliseev Evgeny A.,Svechnikov George S.,Pennycook Stephen J.,Borisevich Albina Y.

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference40 articles.

1. Domains in Ferroic Crystals and Thin Films

2. Ferroelectric Memories

3. Control and imaging of ferroelectric domains over large areas with nanometer resolution in atomically smooth epitaxial Pb(Zr0.2Ti0.8)O3 thin films

4. Physics of the ferroelectric nonvolatile memory field effect transistor

5. Physics of the ferroelectric nonvolatile memory field effect transistor

Cited by 80 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative electric field mapping between electrically biased needles by scanning transmission electron microscopy and electron holography;Ultramicroscopy;2023-11

2. Demand Forecasting with Artificial Neural Networks Approach: An Application in the Metal Goods Manufacturing Industry;Verimlilik Dergisi;2023-10-27

3. Mapping Polar Distortions using Nanobeam Electron Diffraction and a Cepstral Approach;Microscopy and Microanalysis;2023-07-12

4. Systematic Errors of Electric Field Measurements in Ferroelectrics by Unit Cell Averaged Momentum Transfers in STEM;Microscopy and Microanalysis;2023-02-23

5. Probing Electron Beam Induced Transformations on a Single-Defect Level via Automated Scanning Transmission Electron Microscopy;ACS Nano;2022-10-07