Improving electron micrograph signal-to-noise with an atrous convolutional encoder-decoder
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference65 articles.
1. Practical method for noise removal in scanning electron microscopy;Oho;Scanning,1996
2. The impact of stem aberration correction on materials science;Pennycook;Ultramicroscopy,2017
3. Chromatic aberration correction for atomic resolution tem imaging from 20 to 80 kv;Linck;Phys. Rev. Lett.,2016
4. Development of tem and sem high brightness electron guns using cold-field emission from a carbon nanotip;Houdellier;Ultramicroscopy,2015
5. Aberration corrected 1.2-mv cold field-emission transmission electron microscope with a sub-50-pm resolution;Akashi;Appl. Phys. Lett.,2015
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