Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip-Reference-Cited by-同舟云学术

Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Published:2015-04 Issue: Volume:151 Page:107-115
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Houdellier F.,de Knoop L.,Gatel C.,Masseboeuf A.,Mamishin S.,Taniguchi Y.,Delmas M.,Monthioux M.,Hÿtch M.J.,Snoeck E.

Funder

European Integrated Infrastructure Initiative

French “Investissement d’Avenir” Program

French ANR–Emergence Program

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

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4. A.V. Crewe, Scanning techniques for high voltage microscope, in: Proceedings of the AMU-ANL High Voltage Electron Microscope Mtg. (Argonne National Laboratory), 1964, 68.

5. The visibility of single atoms;Crewe;Science,1970

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