Development of TEM and SEM high brightness electron guns using cold-field emission from a carbon nanotip

Author:

Houdellier F.,de Knoop L.,Gatel C.,Masseboeuf A.,Mamishin S.,Taniguchi Y.,Delmas M.,Monthioux M.,Hÿtch M.J.,Snoeck E.

Funder

European Integrated Infrastructure Initiative

French “Investissement d’Avenir” Program

French ANR–Emergence Program

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference31 articles.

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2. Das Feldionenmikroskop;Müller;Z. Physik,1951

3. Recent advances in field electron microscopy of metals;Swanson;Adv. Electron. Electron Phys.,1973

4. A.V. Crewe, Scanning techniques for high voltage microscope, in: Proceedings of the AMU-ANL High Voltage Electron Microscope Mtg. (Argonne National Laboratory), 1964, 68.

5. The visibility of single atoms;Crewe;Science,1970

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