Ultra-high spatial resolution selected area electron channeling patterns-Reference-Cited by-同舟云学术

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Ultra-high spatial resolution selected area electron channeling patterns

Published:2020-03 Issue: Volume:210 Page:112915
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Kerns R.D.,Balachandran S.,Hunter A.H.,Crimp M.A.

Funder

National Science Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. High-resolution elastic strain measurement from electron backscatter diffraction patterns: new levels of sensitivity;Wilkinson;Ultramicroscopy,2006

2. High- resolution electron backscatter diffraction: an emerging tool for studying local deformation;Wilkinson;J. Strain Anal. Eng. Des.,2010

3. Estimations of bulk geometrically necessary dislocation density using high resolution EBSD;Ruggles;Ultramicroscopy,2013

4. Comparison of dislocation characterization by electron channeling contrast imaging and cross-correlation electron backscattered diffraction;Dunlap;Ultramicroscopy,2018

5. Scanning electron microscopy imaging of dislocations in bulk materials, using electron channeling contrast;Crimp;Microsc. Res. Tech,2006

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3. Crystalline defect analysis in epitaxial Si0.7Ge0.3 layer using site-specific ECCI-STEM;Micron;2021-11

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