Atom probe specimen preparation with a dual beam SEM/FIB miller
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference25 articles.
1. Three-dimensional atom probe field-ion microscopy observation of Cu/Co multilayer film structures
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3. Atom Probe Field Ion Microscopy Of Multilayer Thin Films
4. Three-dimensional atom probe studies of metallic multilayers
5. Focused ion-beam specimen preparation for atom probe field-ion microscopy characterization of multilayer film structures
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