Focused ion-beam milling for field-ion specimen preparation:-Reference-Cited by-同舟云学术

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Focused ion-beam milling for field-ion specimen preparation:

Published:1998-12 Issue:3 Volume:75 Page:147-159
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Larson D.J,Foord D.T,Petford-Long A.K,Anthony T.C,Rozdilsky I.M,Cerezo A,Smith G.W.D

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference40 articles.

1. M.K. Miller, G.D.W. Smith, Atom Probe Microanalysis, Materials Research Society, 1989.

2. The art and science and other aspects of making sharp tips

3. The preparation of field electron/field-ion emitters by ion etching

4. A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy

5. High resolution microanalysis of binder phase in as sintered WC–Co cemented carbides

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