Information extraction from FN plots of tungsten microemitters
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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1. Information extraction from Murphy–Good plots of tungsten field electron emitters;Journal of Vacuum Science & Technology B;2021-03
2. Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework;Ultramicroscopy;2018-04
3. Field Electron Emission Characteristics of Single-Walled Carbon Nanotube on Tungsten Blunt Tip;IOP Conference Series: Materials Science and Engineering;2018-02
4. Investigating of the Field Emission Performance on Nano-Apex Carbon Fiber and Tungsten Tips;IOP Conference Series: Materials Science and Engineering;2015-10-12
5. Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork;Current Applied Physics;2015-09
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