Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework-Reference-Cited by-同舟云学术

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Correction of scan line shift artifacts in scanning electron microscopy: An extended digital image correlation framework

Published:2018-04 Issue: Volume:187 Page:144-163
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Maraghechi Siavash,Hoefnagels Johan P.M.,Peerlings Ron H.J.,Geers Marc G.D.

Funder

European Research Council

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

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2. Efficient cross-section preparation method for high-resolution imaging of hard polymer composites with a scanning electron microscope;Brodusch;J. Microsc.,2015

3. 25 year perspective aspects of strain and strength measurement in miniaturised testing for engineering metals and ceramics;Lord;Mater. Sci. Technol.,2010

4. Morphological, thermal, and mechanical properties of poly(ϵ-caprolactone)/poly(ϵ-caprolactone)-grafted-cellulose nanocrystals mats produced by electrospinning;Bellani;J. Appl. Polym. Sci.,2016

5. Effect of POSS content on the electrical, thermal, mechanical, and wetting properties of electrospun polyacrylonitrile (PAN)/POSS nanofibrous mats;Gu;J. Exp. Nanosci.,2016

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