Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork-Reference-Cited by-同舟云学术

Reverse electrochemical etching method for fabricating ultra-sharp platinum/iridium tips for combined scanning tunneling microscope/atomic force microscope based on a quartz tuning fork

Published:2015-09 Issue:9 Volume:15 Page:1015-1021
ISSN:1567-1739
Container-title:Current Applied Physics
language:en
Short-container-title:Current Applied Physics

Author:

Meza J.A. Morán,Polesel-Maris J.,Lubin C.,Thoyer F.,Makky A.,Ouerghi A.,Cousty J.

Funder

Peru’s National Council of Science and Technology (Concytec)

Réseau Thématique de Recherche Avancée (RTRA-Triangle de la Physique)

CEA/Direction des Relations Internationales (DRI)

Publisher

Elsevier BV

Subject

General Physics and Astronomy,General Materials Science

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4. Graphene on Rh(111): scanning tunneling and atomic force microscopies studies;Voloshina;Appl. Phys. Lett.,2012

5. Experimental three-dimensional description of the liquid hexadecane/graphite interface;Pham Van;Langmuir,2009

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