Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum-Reference-Cited by-同舟云学术

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Electrically conducting, ultra-sharp, high aspect-ratio probes for AFM fabricated by electron-beam-induced deposition of platinum

Published:2013-10 Issue: Volume:133 Page:62-66
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Brown Jason,Kocher Paul,Ramanujan Chandra S,Sharp David N,Torimitsu Keiichi,Ryan John F

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Microfabrication of cantilever styli for the atomic force microscope;Albrecht;Journal of Vacuum Science & Technology A–Vacuum Surfaces and Films,1990

2. Advances in AFM for the electrical characterization of semiconductors;Oliver;Reports on Progress in Physics,2008

3. Chemical force microscopy;Noy;Annual Review of Materials Science,1997

4. Carbon nanotube tips for atomic force microscopy;Wilson;Nature Nanotechnology,2009

5. Attachment of carbon nanotubes to atomic force microscope probes;Gibson;Ultramicroscopy,2007

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