Attachment of carbon nanotubes to atomic force microscope probes

Author:

Gibson Christopher T.,Carnally Stewart,Roberts Clive J.

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 43 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

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2. Controlled growth of a single carbon nanotube on an AFM probe;Microsystems & Nanoengineering;2021-10-15

3. Direct modification of conductive AFM probes by focused electron beam induced deposition;2021 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO);2021-08-02

4. Carbon-based Nanomaterials and Curcumin: A Review of Biosensing Applications;Studies on Biomarkers and New Targets in Aging Research in Iran;2021

5. The Attachment of Carbon Nanotubes to Atomic Force Microscopy Tips Using the Pick-Up Method;Applied Sciences;2020-08-12

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