Fabrication of Focused Ion Beam-Deposited Nanowire Probes for Conductive Atomic Force Microscopy

Author:

Gacka Ewelina,Pruchnik Bartosz C.,Tamulewicz-Szwajkowska Magdalena,Badura Dominik,Rangelow Ivo,Gotszalk Teodor P.

Publisher

Elsevier BV

Reference67 articles.

1. Review of scanning probe micromachining and its applications within nanoscience;T Michels;Microelectron Eng,2014

2. Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication;I W Rangelow;Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,2017

3. Experimental study of field emission from ultrasharp silicon, diamond, GaN, and tungsten tips in close proximity to the counter electrode;C Lenk;Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena,2018

4. Multipurpose active scanning probe cantilevers for near-field spectroscopy, scanning tunnel imaging, and atomic-resolution lithography;I Stricklin;Journal of Vacuum Science & Technology B,2023

5. Thermomechanically and electromagnetically actuated piezoresistive cantilevers for fast-scanning probe microscopy investigations;W Majstrzyk;Sens Actuators A Phys,2018

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