An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision-Reference-Cited by-同舟云学术

An integrated constrained gradient descent (iCGD) protocol to correct scan-positional errors for electron ptychography with high accuracy and precision

Published:2023-06 Issue: Volume:248 Page:113716
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Ning Shoucong,Xu Wenhui,Loh Leyi,Lu Zhen,Bosman Michel,Zhang Fucai,He Qian^ORCID

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference29 articles.

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2. Electron ptychography achieves atomic-resolution limits set by lattice vibrations;Chen;Science,2021

3. Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose;Chen;Nat. Commun.,2020

4. Ptychographic electron microscopy using high-angle dark-field scattering for sub-nanometre resolution imaging;Humphry;Nat. Commun.,2012

5. Electron ptychographic microscopy for three-dimensional imaging;Gao;Nat. Commun.,2017

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2. An Efficient and Robust Self-Calibration Algorithm for Translation Position Errors in Ptychography;IEEE Transactions on Instrumentation and Measurement;2024

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