Aberration-corrected STEM/TEM imaging at 15 kV
Author:
Funder
JST
Publisher
Elsevier BV
Subject
Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference19 articles.
1. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage
2. Gentle STEM: ADF imaging and EELS at low primary energies
3. Atom-by-atom spectroscopy at graphene edge
4. Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy
5. Transmission electron microscopy at 20kV for imaging and spectroscopy
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