Design and implementation of a micron-sized electron column fabricated by focused ion beam milling-Reference-Cited by-同舟云学术

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Design and implementation of a micron-sized electron column fabricated by focused ion beam milling

Published:2016-01 Issue: Volume:160 Page:74-79
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Wicki Flavio,Longchamp Jean-Nicolas,Escher Conrad,Fink Hans-Werner

Funder

Swiss National Science Foundation

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Electron microscopy image enhanced;Haider;Nature,1998

2. Aberration correction past and present;Hawkes;Philos. Trans. R. Soc. A Math. Phys. Eng. Sci.,2009

3. Transmission electron microscopy at 20kV for imaging and spectroscopy;Kaiser;Ultramicroscopy,2011

4. Electron dose dependence of signal-to-noise ratio, atom contrast and resolution in transmission electron microscope images;Lee;Ultramicroscopy,2014

5. Low energy electron microscopy of surfaces;Telieps;Surf. Sci.,1988

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