Voltage modulation efficiency in scanning capacitance microscopy-Reference-Cited by-同舟云学术

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Voltage modulation efficiency in scanning capacitance microscopy

Published:2021-05 Issue: Volume:224 Page:113266
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Chang Mao-Nan,Chen Yung-Kuang,Kao Hung-Yi,Chen Jhih-Yang,Liu Chun-Hsien,Lee Yao-Jen

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Dopant imaging of power semiconductor device cross sections

2. Characterization of carrier concentration in CIGS solar cells by scanning capacitance microscopy

3. Observation of metal–oxide–semiconductor transistor operation using scanning capacitance microscopy

4. Outwitting the series resistance in scanning spreading resistance microscopy

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. DC-free Method to Evaluate Nanoscale Equivalent Oxide Thickness: Dark-Mode Scanning Capacitance Microscopy;Nanomaterials;2024-05-26

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