Spectrum imaging measurements with semi-parallel detection using an AES apparatus-Reference-Cited by-同舟云学术

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Spectrum imaging measurements with semi-parallel detection using an AES apparatus

Published:2022-03 Issue: Volume:233 Page:113450
ISSN:0304-3991
Container-title:Ultramicroscopy
language:en
Short-container-title:Ultramicroscopy

Author:

Taguchi Noboru,Uchida Tatsuya,Ikita Konomi,Tanaka Akihiro,Ikeo Nobuyuki,Yokouchi Kazushiro,Tsutsumi Kenichi

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Energy filtered scanning electron microscopy: applications to characterisation of semiconductors;Rodenburg;J. Phys. Conf. Ser.,2010

2. Lithium analysis using reflection EELS for lithium compounds

3. REELS study of a LiNi1/3Mn1/3Co1/3O2 positive electrode;Taguchi;Surf. Interface Anal.,2016

4. Lithium analysis in Li-ion battery materials via a scanning electron microscopy-based approach;Taguchi;Surf. Interface Anal.,2020

5. Determination of absolute number of graphene layers on nickel substrate with scanning Auger microprobe;Shima;Appl. Phys. Express,2020

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Evaluation of Semiconductor Materials Using High-resolution Spectra Extracted from Datacube Measured by <i>Spectrum Image</i> Method of Auger Electron Spectroscopy;Vacuum and Surface Science;2024-08-10

2. New Spectrum Imaging Method for Solid Surfaces with Secondary Electrons acquired over Wide Energy Range (>1000 eV);2023 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA);2023-07-24

3. Introduction of Hyperspectral Mapping Function with a WDS on an EPMA;Microscopy and Microanalysis;2023-07-22

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