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Characterization of magnetic materials using a scanning microwave microprobe

  • Published:2008-09 Issue:10 Volume:108 Page:1030-1033
  • ISSN:0304-3991
  • Container-title:Ultramicroscopy
  • language:en
  • Short-container-title:Ultramicroscopy

Author:

Melikyan Harutyun,Hovsepyan Artur,Sargsyan Tigran,Yoon Youngwoon,Yoo Hyungun,Babajanyan Arsen,Lee Kiejin

Publisher

Elsevier BV

Subject

Instrumentation,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scanning Microwave Microscopy Subsurface Detection of Magneto-Impedance Effect in Thin Film Permalloy;2024 IEEE/MTT-S International Microwave Symposium - IMS 2024;2024-06-16

2. Scanning microwave microscopy technique for nanoscale characterization of magnetic materials;Journal of Magnetism and Magnetic Materials;2016-12

3. Sensitivity analysis of scanning microwave microscopy for nano-scale dopant measurements in Si;Journal of Applied Physics;2012-11-15

4. Near-Field Microwave Microscopy for Nanoscience and Nanotechnology;Scanning Probe Microscopy in Nanoscience and Nanotechnology 2;2010-11-15

5. Calibrated nanoscale capacitance measurements using a scanning microwave microscope;Review of Scientific Instruments;2010-11
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