Author:
Chetwynd D.G.,Liu X.,Smith S.T.
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering
Reference9 articles.
1. Sub-nanometre displacements calibration using x-ray interferometry;Bowen;Meas. Sci. Technol.,1990
2. Slope measurement in surface texture analysis;Chetwynd,1978
3. The digitization of surface profiles;Chetwynd;Wear,1979
4. Criteria for angstrom regime metrology;Lindsey,1988
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