Microstructure characterization of transition films from amorphous to nanocrocrystalline silicon-Reference-Cited by-同舟云学术

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Microstructure characterization of transition films from amorphous to nanocrocrystalline silicon

Published:2003-08 Issue:1-2 Volume:256 Page:27-32
ISSN:0022-0248
Container-title:Journal of Crystal Growth
language:en
Short-container-title:Journal of Crystal Growth

Author:

Xu Yanyue,Liao Xianbo,Kong Guanglin,Zeng Xiangbo,Hu Zhihua,Diao Hongwei,Zhang Shibin

Publisher

Elsevier BV

Subject

Materials Chemistry,Inorganic Chemistry,Condensed Matter Physics

Reference21 articles.

1. Midgap density of states in hydrogenated polymorphous silicon

2. Xu Yan-Yue, Zhang Shi-Bin, Kong Guang-Lin, Hu Zhi-Hua, Zeng Xiang-Bo, Diao Hong-Wei, Liao Xian-Bo, Chin. Phys. Soc. 52 (6) (2002) 1465.

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