Author:
Oliver A.,Castellanos P.,Miranda J.,Ruvalcaba J.L.,Andrade E.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Depth profiling techniques: how PIXE compares to NRP and MEIS?;X-Ray Spectrometry;2011-04-25
2. Thin film thickness determination with neutron activation analysis;Applied Radiation and Isotopes;2001-07
3. Analysis of coated reflective glasses near the surface using IBA techniques;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-09
4. X-Ray Spectrometry;Analytical Chemistry;1994-06-01