Thin film thickness determination with neutron activation analysis-Reference-Cited by-同舟云学术

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Thin film thickness determination with neutron activation analysis

Published:2001-07 Issue:1 Volume:55 Page:9-12
ISSN:0969-8043
Container-title:Applied Radiation and Isotopes
language:en
Short-container-title:Applied Radiation and Isotopes

Author:

Özben C.S,Tepehan F.Z,Güven H.H,Tepehan G.G

Publisher

Elsevier BV

Subject

Radiation

Reference19 articles.

1. Ion beam analysis of ultrathin dielectric films;Baumvol;Nucl. Instr. and Meth.,1995

2. Grazing X-ray reflectometry and Rutherford backscattering: two complementary techniques for the study of thin film mixing;Le Boıté;Nucl. Instr. and Meth.,1988

3. Thickness measurement of titanium nitride layers on steel using proton backscattering;Campbell;Nucl. Instr. and Meth.,1994

4. Complementarity of RBS, PIGE and PIXE for the determination of surface layers of thicknesses up to 30 microns;Demortier;Nucl. Instr. and Meth.,1990

5. Physics of Non-Metallic Thin Films;Dupuy,1976

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Scattering of 7.3 keV conversion electrons from a source covered gradually by gold absorbers of various thicknesses;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2002-08

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