High-resolution X-ray spectrometer for PIXE work
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference9 articles.
1. X-RAY EMISSION FROM ELECTRON CAPTURE INTO 2.4-9 keV/amu O7+, O8+, Ne8+ and Ne9+
2. Position-sensitive X-ray detector
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1. In-situobservation of chemical state change of sulfur in solid targets during MeV proton irradiation;X-Ray Spectrometry;2009-05
2. MEASUREMENT OF CHEMICAL STATE CHANGE OF PHOSPHORUS DURING MEV-PROTON IRRADIATION BY A HIGH-RESOLUTION WAVELENGTH-DISPERSIVE PIXE SYSTEM;International Journal of PIXE;2009-01
3. CHEMICAL STATE ANALYSIS OF Cr AND Fe BY IN-AIR PIXE USING A CURVED CRYSTAL SPECTROMETER COMBINED WITH A POSITION-SENSITIVE PROPORTIONAL COUNTER;International Journal of PIXE;2005-01
4. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04
5. PIXE cross sections for some moderately toxic heavy metals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
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