In-situobservation of chemical state change of sulfur in solid targets during MeV proton irradiation
Author:
Publisher
Wiley
Subject
Spectroscopy
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1. Upgrade of the ion beam analysis end-station with the wavelength dispersive X-ray spectrometer for use with the focused MeV ion beams;Measurement;2024-10
2. Wavelength dispersive μPIXE setup for the ion microprobe;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2015-11
3. Control of the chemical state change of sulfur in solid compound targets during high-resolution PIXE measurements;Journal of the Korean Physical Society;2012-07
4. Application of a wavelength-dispersive particle-induced X-ray emission system to chemical speciation of phosphorus and sulfur in lake sediment samples;Spectrochimica Acta Part B: Atomic Spectroscopy;2010-01
5. Target Temperature Rise and Gas Emission during Chemical State Analysis by WD-PIXE Measurement;AIP Conference Proceedings;2010
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