High resolution PIXE instrumentation survey. Part III

Author:

Petukhov V.P.,Török I.,Terasawa M.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 11 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High resolution energy dispersive spectrometry (HiREDS), a new tool for X-ray emission work;Journal of Analytical Atomic Spectrometry;2023

2. Foundations and trends of high resolution energy dispersive PIXE (HiRED-PIXE);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

3. H+and He2 +induced W L X-rays intensity ratios: part I, Si(Li) data and EDS high resolution insight;X-Ray Spectrometry;2013-02-12

4. Control of the chemical state change of sulfur in solid compound targets during high-resolution PIXE measurements;Journal of the Korean Physical Society;2012-07

5. Dependence of relative intensity of L1 sub-shell X-rays on ion beam energy;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-08

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