High resolution PIXE instrumentation survey, part I

Author:

Terasawa M.,Török I.,Petukhov V.P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. High resolution energy dispersive spectrometry (HiREDS), a new tool for X-ray emission work;Journal of Analytical Atomic Spectrometry;2023

2. Foundations and trends of high resolution energy dispersive PIXE (HiRED-PIXE);Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2020-09

3. Particle induced X-ray emission – relative yield ion energy dependence, an IBA chemical speciation method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2005-04

4. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04

5. HIGH RESOLUTION PIXE INSTRUMENTATION SURVEY, PART IV;International Journal of PIXE;1999-01

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