Foundations and trends of high resolution energy dispersive PIXE (HiRED-PIXE)-Reference-Cited by-同舟云学术

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Foundations and trends of high resolution energy dispersive PIXE (HiRED-PIXE)

Published:2020-09 Issue: Volume:479 Page:187-193
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Reis M.A.,Carvalho A.,Taborda A.,Chaves P.C.,Conceição P.,Madureira P.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference32 articles.

1. X-ray analysis: elemental trace analysis at the 10-12g level;Johanson;Nucl. Instrum. Methods,1970

2. Analytical applications of particle induced X-ray emission;Johansson;Nucl. Instrum. Methods Phys. Res.,1976

3. Applications of wavelength-dispersive spectrometry in particle-induced X-ray emission analysis;Watson;Nucl. Instrum. Methods,1977

4. High-resolution PIXE instrumentation survey. Part I;Terasawa;Nucl. Instrum. Methods Phys. Res. B,1993

5. High-resolution PIXE instrumentation survey. Part II;Petukhov;Nucl. Instrum. Methods Phys. Res. B,1999

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High resolution energy dispersive spectrometry (HiREDS), a new tool for X-ray emission work;Journal of Analytical Atomic Spectrometry;2023

2. Improving the accuracy of alpha particle induced X-ray emission analysis: The role of multiple ionization K X-ray satellites;Spectrochimica Acta Part B: Atomic Spectroscopy;2022-08

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