Damage in semiconductor materials during heavy-ion elastic recoil detection analysis-Reference-Cited by-同舟云学术

Damage in semiconductor materials during heavy-ion elastic recoil detection analysis

Published:1996-06 Issue:1-4 Volume:113 Page:312-316
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Walker S.R.,Johnston P.N.,Bubb I.F.,Stannard W.B.,Jamieson D.N.,Dooley S.P.,Cohen D.D.,Dytlewski N.,Martin J.W.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference8 articles.

4. Applications of Ion Beam Analysis Workshop;Davies,1995

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

2. Recent applications of nuclear microprobe analysis to frontier materials;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07

3. Ion beam induced damage in InP during heavy-ion elastic recoil detection analysis;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07