Author:
Nishijima T.,Sekiguchi H.,Matsuda S.,Takeuchi M.,Shiono N.,Anayama H.,Mirio A.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
5 articles.
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1. Radiation damage on 6H-SiC Schottky diodes;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2003-09
2. Development of a fast multi-parameter data acquisition system for microbeam analyses;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
3. Research of Si and GaAs diode structures by Ion Beam Induced Charge (IBIC) collection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
4. Study of basic mechanisms of semiconductor devices using ion beam induced charge (IBIC) collection;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07
5. Imaging with high velocity focused ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-09