Basic requirements for quantitative SIMS analysis using cesium bombardment and detection of MCs+ secondary ions
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference21 articles.
1. Evaluation of a cesium positive ion source for secondary ion mass spectrometry
2. Quantitative analysis and depth profiling of rare gases in solids by secondary‐ion mass spectrometry: Detection of (CsR)+ molecular ions (R=rare gas)
3. A new secondary ion mass spectrometry technique for III‐V semiconductor compounds using the molecular ions CsM+
4. Secondary Ion Mass Spectrometry, SIMS VII;Magee,1990
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