Mass spectral analysis and quantification of Secondary Ion Mass Spectrometry data
Author:
Publisher
Elsevier BV
Subject
Physical and Theoretical Chemistry,Spectroscopy,Condensed Matter Physics,Instrumentation
Reference23 articles.
1. Diffusion of Boron, Phosphorus, Arsenic, and Antimony in Thermally Grown Silicon Dioxide
2. Evaluation of Microstructural, Mechanical Properties and Corrosion Behavior of AISI Type 316LN Stainless Steel and Modified 9Cr-1Mo Steel Exposed in a Dynamic Bimetallic Sodium Loop at 798 K (525 °C) for 16,000 Hours
3. A study of the effect of titanium on the void swelling behavior of D9 steels by ion beam simulation
4. Mechanism of the SIMS matrix effect
5. Matrix effect in SIMS analysis using an O2+ primary beam
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1. Comparison of quantitative elemental depth distribution analyses of Ni and Ti in co-sputtered Ni-Ti alloy thin films using MCs+ and M+ secondary ions;Thin Solid Films;2022-07
2. Quantitative depth distribution analysis of elements in high alloy steel using MCs+-SIMS approach;International Journal of Mass Spectrometry;2018-07
3. Shallow nitrogen ion implantation: Evolution of chemical state and defect structure in titanium;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-09
4. Depth distribution of Mn in Mn doped GaAs using secondary ion mass spectrometry;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-05
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