Methods of adapting ion beam analysis techniques for use on curved surfaces-Reference-Cited by-同舟云学术

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Methods of adapting ion beam analysis techniques for use on curved surfaces

Published:1992-03 Issue:4 Volume:63 Page:434-444
ISSN:0168-583X
Container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
language:en
Short-container-title:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Author:

Berning Paul R.,Niiler Andrus

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Reference9 articles.

1. Ion beam analysis of combustion synthesized ceramics

2. Backscattering Spectroscopy;Chu,1978

3. Algorithms for the rapid simulation of Rutherford backscattering spectra

4. Growth and morphology kinetics of adsorbate structures on silicon

5. The shape of the ion backscattering spectrum for a surface having sine wave relief

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Backscattering analysis of thin films on non-flat surfaces;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1993-02

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