Depth profiling of element concentration using low energy proton induced X-ray emission

Author:

Shaanan M.,Richter V.,Kalish R.

Publisher

Elsevier BV

Subject

Instrumentation,Nuclear and High Energy Physics

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Physico-chemical and electrochemical characterization of Ti/RhOx–IrO2 electrodes using sol–gel technology;Materials Chemistry and Physics;2010-11

2. Development of a compact and user-friendly ion irradiation system controlled remotely through the Internet;J NUCL SCI TECHNOL;2007

3. Development of a Compact and User-friendly Ion Irradiation System Controlled Remotely through the Internet;Journal of Nuclear Science and Technology;2007-08

4. Differential PIXE measurements of thin metal layers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2004-06

5. Reconstruction of Ar depth profiles from PIXE measurements;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1994-03

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