Author:
Bethge K.,Mader A.,Meyer J.D.
Subject
Instrumentation,Nuclear and High Energy Physics
Cited by
9 articles.
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1. High Energy Ion Beam Analysis Techniques;Materials Science and Technology;2006-09-15
2. Investigation of 〈100〉 silicon samples on cyclotron beams with channeling method;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-04
3. Investigation of ultra thin SiNxOy layers produced by low-energy ion implantation with NRA and channeling-RBS;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1996-01
4. Computer simulation of channeling in Si and GaAs crystals;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1995-05
5. Combined NRA, channeling-RBS and FTIR ellipsometry analyses for the determination of the interface and bonding state of thin SiOx and SiNxOy layers;Fresenius' Journal of Analytical Chemistry;1995