Heavy ion backscattering spectrometry (HIBS) — An improved technique for trace element detection
Author:
Publisher
Elsevier BV
Subject
Instrumentation,Nuclear and High Energy Physics
Reference7 articles.
1. Ion Implantation in Semiconductors;Mayer,1970
2. Relative X-ray cross sections and sensitivity of PIXE and RBS in surface analysis
3. Nuclear microanalysis using MeV carbon ion backscattering; usefulness and applications
4. The detection sensitivity of heavy impurities in Si using 280 keV He2+ and C2+ back-scattering
5. Algorithms for the rapid simulation of Rutherford backscattering spectra
Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. High-sensitivity Rutherford backscattering spectrometry employing an analyzing magnet and silicon strip detector;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-01
2. High sensitivity Rutherford backscattering spectrometry using multidetector digital pulse processing;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2018-03
3. Triassico: A Sphere Positioning System for Surface Studies with IBA Techniques;Physics Procedia;2017
4. Heavy-Ion Backscattering Spectrometry;Characterization of Materials;2012-10-12
5. Stopping cross sections of 50- to 230-keV nitrogen ions in silicon measured by ion backscattering spectroscopy;Technical Physics;2009-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3